Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11668655 | Multimode defect classification in semiconductor inspection | Grace Hsiu-Ling Chen, Amrit Poudel, Mark Wang | 2023-06-06 |
| 11580650 | Multi-imaging mode image alignment | Bjorn Brauer | 2023-02-14 |