Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11726139 | In-system test of chips in functional systems | Jae Wu, Andi Skende, Rajith Mavila | 2023-08-15 |
| 11668750 | Performing testing utilizing staggered clocks | Sailendra Chadalavada, Venkat Abilash Reddy Nerallapally, Jaison Daniel Kurien, Bonita Bhaskaran, Milind Sonawane +1 more | 2023-06-06 |
| 11573872 | Leveraging low power states for fault testing of processing cores at runtime | Jonah M. Alben, Sachin Satish Idgunji, Jue Wu | 2023-02-07 |