Issued Patents 2023
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11782072 | Test arrangement for testing high-frequency components, particularly silicon photonics devices under test | Zhan Zhang, Hubert Werkmann, Fabio Pizza, Paolo Mazzucchelli | 2023-10-10 |
| 11747383 | Determining performance metrics for a device under test using nearfield measurement results | — | 2023-09-05 |
| 11742960 | Test equipment for testing a device under test having a circuit coupled to an antenna | Jan Hesselbarth | 2023-08-29 |
| 11561242 | Test arrangement for testing high-frequency components, particularly silicon photonics devices under test | Zhan Zhang, Hubert Werkmann, Fabio Pizza, Paolo Mazzucchelli | 2023-01-24 |