Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11579994 | Fast and scalable methodology for analog defect detectability analysis | Mayukh Bhattacharya, Huiping Huang | 2023-02-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11579994 | Fast and scalable methodology for analog defect detectability analysis | Mayukh Bhattacharya, Huiping Huang | 2023-02-14 |