Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815810 | Measurement tool and methods for EUV lithography masks | Yoshihiro Tezuka, Marieke Ordway | 2023-11-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815810 | Measurement tool and methods for EUV lithography masks | Yoshihiro Tezuka, Marieke Ordway | 2023-11-14 |