Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11804413 | Product design for test to enable electrical non-destructive test for measuring multi-chip interconnect defects | George J. Morales, Oscar Mendoza, Kartik Ramanujachar, Michael S. Chun, Anthony Zisko | 2023-10-31 |