Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11788929 | Techniques for wafer level die testing using sacrificial structures | Pradeep Srinivasan | 2023-10-17 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11788929 | Techniques for wafer level die testing using sacrificial structures | Pradeep Srinivasan | 2023-10-17 |