Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11682179 | Measuring method | Kao-Chi Lin, Cho-Fan Hsieh, Teng-Chun Wu, Cheng-Yu Peng | 2023-06-20 |
| 11573175 | Calibration assembly for scan device and calibration system | Wei-Yu Lin, Chia-Jen LIN, Chin Lien, Cho-Fan Hsieh | 2023-02-07 |