Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11733295 | Methods and systems for identifying flaws and bugs in integrated circuits, for example, microprocessors | Arun Joseph, Wolfgang Roesner, Viresh Paruthi, Shiladitya Ghosh | 2023-08-22 |