Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11808808 | Testing a single chip in a wafer probing system | Thomas Gentner, Otto A. Torreiter | 2023-11-07 |
| 11574695 | Logic built-in self-test of an electronic circuit | Thomas Gentner, Michael Kugel, Otto A. Torreiter | 2023-02-07 |