Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11652150 | Charge trap evaluation method and semiconductor element | Kuniyuki Kakushima, Takuya Hoshii, Hitoshi Wakabayashi, Hiroshi Iwai, Taiki YAMAMOTO | 2023-05-16 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11652150 | Charge trap evaluation method and semiconductor element | Kuniyuki Kakushima, Takuya Hoshii, Hitoshi Wakabayashi, Hiroshi Iwai, Taiki YAMAMOTO | 2023-05-16 |