Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11733264 | Cantilever, scanning probe microscope, and measurement method using scanning probe microscope | Kaifeng Zhang, Takenori Hirose | 2023-08-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11733264 | Cantilever, scanning probe microscope, and measurement method using scanning probe microscope | Kaifeng Zhang, Takenori Hirose | 2023-08-22 |