Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11836967 | Method and device for small sample defect classification and computing equipment | Jie Liu, Jifeng Tian, Shunran Di, Yifan Zhang | 2023-12-05 |
| 11741593 | Product defect detection method, device and system | Jie Liu, Jifeng Tian, Shunran Di, Yifan Zhang | 2023-08-29 |