Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852465 | Wafer inspection method and apparatus thereof | Shang-Chi Wang, Miao Chen, Han-Zong Wu, Chia-Chi Tsai | 2023-12-26 |
| 11845030 | Method for collecting dust from single crystal growth system and dust collecting system thereof | Masami Nakanishi, Yu-Sheng Su | 2023-12-19 |
| 11708642 | Mono-crystalline silicon growth apparatus | Chun-Hung Chen, Hsing-Pang Wang, Wen-Ching Hsu | 2023-07-25 |