Issued Patents 2023
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11840722 | Diagnostic systems and methods | David A. Buse, David Opalsky, Jason F. Rhubottom, Jennifer L. TIDD | 2023-12-12 |
| 11840727 | Method for applying thermal energy to a receptacle and detecting an emission signal from the receptacle | David A. Buse, David H. COMBS, David Opalsky, Bruce Richardson, Anita Prasad +3 more | 2023-12-12 |
| 11834701 | Reagent pack changer | David A. Buse, David Opalsky | 2023-12-05 |
| 11809947 | Methods and systems for reading machine-readable labels on sample receptacles | David Opalsky, Rolf Silbert | 2023-11-07 |
| 11788128 | Apparatus for applying thermal energy to a receptacle and detecting an emission signal from the receptacle | David A. Buse, David H. COMBS, David Opalsky, Bruce Richardson, Anita Prasad +2 more | 2023-10-17 |
| 11788115 | Interlocking cap and vial | David A. Buse, David Opalsky, Bruce Richardson, Anita Prasad, Tyler Moore +1 more | 2023-10-17 |
| 11761027 | System and method for receiving and storing reagent packs in an instrument | David A. Buse, David Opalsky | 2023-09-19 |
| 11746373 | Processing vial and cap | Byron J. Knight, David A. Buse, David Opalsky, Tyler Moore, Anita Prasad +1 more | 2023-09-05 |
| 11732288 | Assembly having reagent pack loading station | David A. Buse, David Opalsky | 2023-08-22 |
| 11732289 | Receptacle distribution system | David A. Buse, David Opalsky | 2023-08-22 |
| 11693190 | Indexing signal detecting module | David Opalsky | 2023-07-04 |
| 11692220 | Apparatus for applying thermal energy to a receptacle and detecting an emission signal from the receptacle | David A. Buse, David H. COMBS, David Opalsky, Bruce Richardson, Anita Prasad +3 more | 2023-07-04 |
| D982177 | Vial with cap | Byron J. Knight, David A. Buse, David Opalsky, Tyler Moore, Anita Prasad +1 more | 2023-03-28 |
| 11585760 | Optical signal detection modules and methods | George T. Walker, David H. COMBS | 2023-02-21 |
| 11543349 | Method for calibrating or monitoring performance of an optical measurement device | David Opalsky, George T. Walker, Byron J. Knight | 2023-01-03 |