Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11587762 | Device and method for determining a property of a sample that is to be used in a charged particle microscope | Matthijn Robert-Jan Vos, Ondrej Shanel, Peet Goedendorp | 2023-02-21 |