JP

Jiri Petrek

FE Fei: 1 patents #27 of 106Top 30%
📍 Brno, CZ: #30 of 132 inventorsTop 25%
Overall (2023): #395,769 of 537,848Top 75%
1
Patents 2023

Issued Patents 2023

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11598733 Method of examining a sample using a charged particle microscope Tomas Tuma, Jan Klusá{hacek over (c)}ek 2023-03-07