EF

Erik Franken

FE Fei: 3 patents #5 of 106Top 5%
📍 Nuenen, NL: #2 of 26 inventorsTop 8%
Overall (2023): #80,762 of 537,848Top 20%
3
Patents 2023

Issued Patents 2023

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
11799486 Systems and methods for quantum computing based sample analysis Valentina Caprara Vivoli, Yuchen Deng 2023-10-24
11756762 Rotating sample holder for random angle sampling in tomography Bart Jozef Janssen, Edwin Verschueren 2023-09-12
11742175 Defective pixel management in charged particle microscopy Bart Jozef Janssen 2023-08-29