Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11555828 | Testing probe system for testing semiconductor die, multi-channel die having shared pads, and related systems and methods | Vikrant Upadhyaya | 2023-01-17 |
TA
Tsuneo Abe
Overall (2023): #220,286 of 537,848Top 45%
1
Patents 2023