IL

Iyun Leu

ES Elite Semiconductor: 6 patents #1 of 1Top 100%
Overall (2023): #22,344 of 537,848Top 5%
6
Patents 2023

Issued Patents 2023

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
11774372 Smart coordinate conversion and calibration system in semiconductor wafer manufacturing 2023-10-03
11774373 Smart coordinate conversion and calibration system in semiconductor wafer manufacturing 2023-10-03
11761904 Smart defect calibration system in semiconductor wafer manufacturing 2023-09-19
11719648 Method for smart conversion and calibration of coordinate 2023-08-08
11719649 Method for smart conversion and calibration of coordinate 2023-08-08
11719650 Method for performing smart semiconductor wafer defect calibration 2023-08-08