Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11768239 | Method and apparatus for timing-annotated scan-chain testing using parallel testbench | Sreekanth G. Pai, Mallikarjunarao Thummalapalli | 2023-09-26 |
| 11662382 | Method and apparatus for contemporary test time reduction for JTAG | Umesh Prabhakar Hade | 2023-05-30 |