Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11668658 | Multi-parameter inspection apparatus for monitoring of additive manufacturing parts | — | 2023-06-06 |
| 11625968 | Systems, methods and devices for processing coins with linear array of coin imaging sensors | Tomasz M. Jagielinski, Mathew Tomor, David J. Mecklenburg, Danny D. Yang | 2023-04-11 |