| #48 |
Werner Juengling |
Micron |
1 |
| #48 |
Tyler L. Betz |
Micron |
1 |
| #48 |
Kiyo Fujimoto |
Boise State University |
1 |
| #48 |
Johnn William Hieb |
— |
1 |
| #48 |
Rachael R. Skreen |
Micron |
1 |
| #48 |
Stian E. Wood |
Micron |
1 |
| #48 |
Tige H. Fiedor |
Baseline |
1 |
| #48 |
Scott J. Frank |
— |
1 |
| #48 |
Darin D. Lindig |
HP |
1 |
| #48 |
Josiah Jebaraj Johnley Muthuraj |
Micron |
1 |
| #48 |
Nicole Lundy |
Applied Materials |
1 |
| #48 |
Jeremy W. Butterfield |
Micron |
1 |
| #48 |
Nicholas Stoppello |
— |
1 |
| #48 |
Dustin L. Holloway |
Micron |
1 |
| #48 |
Joshua R. McIver |
Uledger |
1 |
| #48 |
John B. Pusey |
Micron |
1 |
| #48 |
Jeffrey Michael Hill |
House Of Design |
1 |
| #48 |
Thomas Mercer |
Micron |
1 |
| #48 |
Sandeep Reddy Kadasani |
Micron |
1 |
| #48 |
Lael H. Matthews |
Micron |
1 |
| #48 |
Yao Jin |
Micron |
1 |
| #48 |
C. Omar Benitez |
Micron |
1 |
| #48 |
Brett Green |
HP |
1 |
| #48 |
Jan W. de Weerd |
AT&T |
1 |
| #48 |
Peter David Engblom |
Asml Netherlands B.V. |
1 |
| #48 |
Farrell M. Good |
Micron |
1 |
| #48 |
Brandon Saedi |
— |
1 |
| #48 |
Andrew R. Curran |
Arthrex |
1 |
| #48 |
Brandon R. Nixon |
Micron |
1 |
| #48 |
Jonathan S. Hacker |
Micron |
1 |
| #48 |
Pratap Murali |
Micron |
1 |
| #48 |
David K. Ovard |
Micron |
1 |
| #48 |
Michael J. Bernhardt |
Micron |
1 |
| #48 |
John M. French |
Sturm, Ruger & Company |
1 |
| #48 |
Scott Churchwell |
onsemi |
1 |
| #48 |
Woohee Kim |
Micron |
1 |
| #48 |
Zhiqiang Xie |
Micron |
1 |
| #48 |
Min Yup JANG |
onsemi |
1 |
| #48 |
Joan M. Kash |
Micron |
1 |
| #48 |
Andrew S. Price |
Versata Development Group |
1 |
| #48 |
Gavin Huggins |
Micron |
1 |
| #48 |
Kevin Pearson |
HP |
1 |
| #48 |
Matthew Covalt |
Micron |
1 |
| #48 |
Jay Takeji Hirata |
Idaho Scientific |
1 |
| #48 |
Bryan Allen |
Google |
1 |
| #48 |
Qing Chen |
Nanjing Forestry University |
1 |
| #48 |
Thomas Saedi |
— |
1 |
| #48 |
Patrick Churchman |
— |
1 |
| #48 |
Ben Whitaker |
— |
1 |
| #48 |
David Bruce Walker |
J.R. Simplot |
1 |