Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11609261 | Wafer inspection system and wafer inspection equipment thereof | Wei-Chih Chen, Yi-Yen Lin | 2023-03-21 |
| 11585845 | Wafer testing device of flip chip VCSEL | — | 2023-02-21 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11609261 | Wafer inspection system and wafer inspection equipment thereof | Wei-Chih Chen, Yi-Yen Lin | 2023-03-21 |
| 11585845 | Wafer testing device of flip chip VCSEL | — | 2023-02-21 |