Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11817231 | Detection system for X-ray inspection of an object | Johannes Ruoff, Juan Atkinson Mora, Thomas A. Case, Heiko Feldmann, Thomas Matthew Gregorich +1 more | 2023-11-14 |
| 11645792 | Edge phase effects removal using wavelet correction and particle classification using combined absorption and phase contrast | Matthew Andrew, Lars Omlor, Hrishikesh Bale | 2023-05-09 |