Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828713 | Semiconductor inspection tool system and method for wafer edge inspection | Carmel Yehuda Drillman, Moshe Edri, Baheej Bathish, Mordi Dahan | 2023-11-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828713 | Semiconductor inspection tool system and method for wafer edge inspection | Carmel Yehuda Drillman, Moshe Edri, Baheej Bathish, Mordi Dahan | 2023-11-28 |