Issued Patents 2023
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11688067 | Methods and systems for detecting defects in devices using X-rays | David L. Adler, Freddie Erich Babian | 2023-06-27 |
| 11662479 | Methods and systems for printed circuit board design based on automatic corrections | David L. Adler, Freddie Erich Babian | 2023-05-30 |
| 11651492 | Methods and systems for manufacturing printed circuit board based on x-ray inspection | David L. Adler, Freddie Erich Babian, Andrew George Reid, Benjamin Thomas Adler | 2023-05-16 |
| 11615533 | Methods and systems for product failure prediction based on X-ray image re-examination | David L. Adler, Douglas A. Chrissan | 2023-03-28 |