HN

Han-Kwang Nienhuys

AN Asml Holding N.V.: 1 patents #4 of 52Top 8%
AB Asml Netherlands B.V.: 1 patents #223 of 696Top 35%
📍 Utrecht, NL: #59 of 188 inventorsTop 35%
Overall (2023): #429,950 of 537,848Top 80%
1
Patents 2023

Issued Patents 2023

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11803119 Contaminant detection metrology system, lithographic apparatus, and methods thereof Michal Emanuel Pawlowski, Aage Bendiksen, Ryan Alan Munden 2023-10-31