CJ

Chih-Yu JEN

AB Asml Netherlands B.V.: 1 patents #223 of 696Top 35%
🗺 New York: #4,092 of 11,993 inventorsTop 35%
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1
Patents 2023

Issued Patents 2023

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11651935 Time-dependent defect inspection apparatus Long Ma, Yongjun Wang, Jun Jiang 2023-05-16