Issued Patents 2023
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11694934 | FIB delayering endpoint detection by monitoring sputtered materials using RGA | — | 2023-07-04 |
| 11636997 | Uniform milling of adjacent materials using parallel scanning fib | — | 2023-04-25 |
| 11626267 | Back-scatter electrons (BSE) imaging with a SEM in tilted mode using cap bias voltage | Igor Petrov | 2023-04-11 |
| 11598633 | Analyzing a buried layer of a sample | Alexander Mairov, Gal Bruner | 2023-03-07 |