Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828714 | Image acquisition by an electron beam examination tool for metrology measurement | Bobin Mathew SKARIA, Anirban Ghosh, Nitin Singh Malik | 2023-11-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828714 | Image acquisition by an electron beam examination tool for metrology measurement | Bobin Mathew SKARIA, Anirban Ghosh, Nitin Singh Malik | 2023-11-28 |