Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11854184 | Determination of defects and/or edge roughness in a specimen based on a reference image | Shaul Cohen, Noam Zac | 2023-12-26 |
| 11631179 | Segmentation of an image of a semiconductor specimen | Elad Ben Baruch, Shaul Cohen, Tal Ben-Shlomo | 2023-04-18 |