Issued Patents 2023
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11687008 | Method for automated critical dimension measurement on a substrate for display manufacturing, method of inspecting a large area substrate for display manufacturing, apparatus for inspecting a large area substrate for display manufacturing and method of operating thereof | Bernhard Mueller, Robert Trauner, Bernhard Schuler, Kulpreet Singh VIRDI, Volker Daiker | 2023-06-27 |