Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11646173 | Scanning electron microscope and a method for overlay monitoring | Itay Asulin, Emil Weisz, Eitam Yitzchak Vinegrad, Menachem Lapid | 2023-05-09 |
BR
Boris Rozensvaig
Overall (2023): #503,445 of 537,848Top 95%
1
Patents 2023