Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11754609 | Temperature test apparatus and temperature test method | Takeshi Kobayashi, Yasuhiko Nago, Marco Angelo Del Pilar Samonte | 2023-09-12 |
| 11624765 | Test device and a test method | Hiroyuki Baba, Masafumi Setsu | 2023-04-11 |