Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11823425 | Few-shot defect detection method based on metric learning | Jun Wang, Zhongde Shan, Dawei Li | 2023-11-21 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11823425 | Few-shot defect detection method based on metric learning | Jun Wang, Zhongde Shan, Dawei Li | 2023-11-21 |