Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11493909 | Method for detecting environmental parameter in semiconductor fabrication facility | Lee-Chun Chen, Yi Yang | 2022-11-08 |
CH
Chia-Lin Hsu
Overall (2022): #500,261 of 548,613Top 95%
1
Patents 2022