Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11493909 | Method for detecting environmental parameter in semiconductor fabrication facility | Yi Yang, Chia-Lin Hsu | 2022-11-08 |
LC
Lee-Chun Chen
Overall (2022): #362,643 of 548,613Top 70%
1
Patents 2022