Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11454664 | Testing system | Kentaro Konishi, Jun Fujihara, Hiroki Shikagawa, Hiroshi Yamada, Yukinori Murata +8 more | 2022-09-27 |
| 11428712 | Analysis device and image generation method | — | 2022-08-30 |