Issued Patents 2022
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11525859 | Insertion/extraction mechanism and method for replacing block member | Hiroaki Sakamoto, Masanori Ueda | 2022-12-13 |
| 11467208 | Contact release method in inspection apparatus and inspection apparatus | Kentaro Konishi | 2022-10-11 |
| 11454664 | Testing system | Kentaro Konishi, Hiroki Shikagawa, Hiroshi Yamada, Yukinori Murata, Katsuaki Sugiyama +8 more | 2022-09-27 |
| 11442096 | Testing apparatus | Kentaro Konishi | 2022-09-13 |
| 11385283 | Chuck top, inspection apparatus, and chuck top recovery method | — | 2022-07-12 |
| 11360115 | Inspection system | Takanori Hyakudomi, Hiroaki Sakamoto, Tomoya Endo, Xingjun Jiang | 2022-06-14 |
| 11307223 | Inspection device and method of controlling temperature of probe card | Jun Mochizuki | 2022-04-19 |
| 11269004 | Inspection apparatus and inspection method for inspecting electrical characteristic of electronic device | — | 2022-03-08 |
| 11249132 | Prober and method of preheating probe card | — | 2022-02-15 |
| 11215640 | Prober and probe card cleaning method | — | 2022-01-04 |