Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11231376 | Method for semiconductor wafer inspection and system thereof | Chien-Huei Chen, Xiaomeng Chen | 2022-01-25 |
HC
Hung-Yi Chung
Overall (2022): #428,152 of 548,613Top 80%
1
Patents 2022