Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11231376 | Method for semiconductor wafer inspection and system thereof | Hung-Yi Chung, Xiaomeng Chen | 2022-01-25 |
CC
Chien-Huei Chen
Overall (2022): #503,111 of 548,613Top 95%
1
Patents 2022