Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11380596 | Semiconductor test apparatus, semiconductor device test method, and semiconductor device manufacturing method | Yuji Ebiike, Takaya Noguchi, Yoshinori Ito, Yoshikazu Ikuta | 2022-07-05 |
| 11238738 | Information providing system, server, mobile terminal, and computer program | Toshihiro ICHIMARU, Shingo Ohashi, Izumi Memezawa, Yasuhiko Nishi, Katsunori Ushida | 2022-02-01 |