Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11380596 | Semiconductor test apparatus, semiconductor device test method, and semiconductor device manufacturing method | Takaya Noguchi, Yoshinori Ito, Yoshikazu Ikuta, Koichi Takayama | 2022-07-05 |