DX

Deying Xia

CG Carl Zeiss Microscopy Gmbh: 1 patents #41 of 120Top 35%
CG Carl Zeiss Smt Gmbh: 1 patents #29 of 139Top 25%
📍 Albuquerque, NM: #135 of 493 inventorsTop 30%
🗺 New Mexico: #219 of 853 inventorsTop 30%
Overall (2022): #474,179 of 548,613Top 90%
1
Patents 2022

Issued Patents 2022

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11378532 Inspection system and inspection method to qualify semiconductor structures Brett Lewis, Wilhelm Kuehn, Shawn McVey, Ulrich Mantz 2022-07-05