Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378532 | Inspection system and inspection method to qualify semiconductor structures | Brett Lewis, Wilhelm Kuehn, Deying Xia, Shawn McVey | 2022-07-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378532 | Inspection system and inspection method to qualify semiconductor structures | Brett Lewis, Wilhelm Kuehn, Deying Xia, Shawn McVey | 2022-07-05 |