Issued Patents 2022
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11519936 | Scanning probe microscope and scanning probe microscope optical axis adjustment method | — | 2022-12-06 |
| 11499989 | Surface analysis device | Kanji Kobayashi | 2022-11-15 |
| 11454647 | Scanning type probe microscope and control device for scanning type probe microscope | Kazuma Watanabe, Keita Fujino, Kenji Yamasaki, Hideo Nakajima, Yuichiro Ikeda +1 more | 2022-09-27 |
| 11415596 | Scanning probe microscope and analysis method | Hiroshi Arai | 2022-08-16 |