TA

Takahiro Arakawa

IC Ihi Inspection And Instrumentation Co.: 1 patents #1 of 3Top 35%
Overall (2022): #242,681 of 548,613Top 45%
1
Patents 2022

Issued Patents 2022

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11293905 Phased-array flaw-detection device and method Shintaro Fukumoto, Hiraku Kawasaki 2022-04-05