SF

Shintaro Fukumoto

IC Ihi Inspection And Instrumentation Co.: 1 patents #1 of 3Top 35%
Overall (2022): #263,565 of 548,613Top 50%
1
Patents 2022

Issued Patents 2022

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11293905 Phased-array flaw-detection device and method Hiraku Kawasaki, Takahiro Arakawa 2022-04-05