Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11513084 | Nondestructive inspecting system, and nondestructive inspecting method | Shigenori Nagano, Hanako AIKOH, Yuichi Yoshimura, Hideyuki Sunaga | 2022-11-29 |
| 11307153 | Method and device for acquiring tomographic image data by oversampling, and control program | Takaoki Takanashi, Shigeho NODA, Masaru Tamura | 2022-04-19 |